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USB: coding style fixes (structure naming)
[bertos.git]
/
bertos
/
drv
/
dataflash.h
diff --git
a/bertos/drv/dataflash.h
b/bertos/drv/dataflash.h
index 4b4e994ddd862f6f8db990a24e559026eb6de810..90dac59c52768bee88394ec12804fdc375556d75 100644
(file)
--- a/
bertos/drv/dataflash.h
+++ b/
bertos/drv/dataflash.h
@@
-32,7
+32,6
@@
*
* \brief Function library for dataflash AT45DB family.
*
*
* \brief Function library for dataflash AT45DB family.
*
- * \version $Id$
*
* \author Daniele Basile <asterix@develer.com>
*
*
* \author Daniele Basile <asterix@develer.com>
*
@@
-48,7
+47,7
@@
#include <cfg/compiler.h>
#include <cfg/compiler.h>
-#include <
kern
/kfile.h>
+#include <
io
/kfile.h>
#include <fs/battfs.h>
/**
#include <fs/battfs.h>
/**
@@
-197,7
+196,9
@@
bool dataflash_diskInit(struct BattFsSuper *d, DataFlash *fd, pgcnt_t *page_arra
*
* (see drv/datafalsh_test.c for more detail)
*/
*
* (see drv/datafalsh_test.c for more detail)
*/
-int dataflash_testSetUp(void);
+int dataflash_testSetup(void);
+/* For backward compatibility */
+#define dataflash_testSetUp() dataflash_testSetup()
int dataflash_testRun(void);
int dataflash_testTearDown(void);
int dataflash_testRun(void);
int dataflash_testTearDown(void);